Test Generation of Crosstalk Delay Faults in VLSI Circuits

,

Achat E-Book : Test Generation of Crosstalk Delay Faults in VLSI Circuits - S. Jayanthy - M.C. Bhuvaneswari
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

Ma liste d'envies

Test Generation of Crosstalk Delay Faults in VLSI Circuits

Test Generation of Crosstalk Delay Faults in VLSI Circuits

S. Jayanthy

M.C. Bhuvaneswari

Caractéristiques du produit :
E-Book
Référence : 9789811324932
Sortie le : 20/09/2018
Editeur : SPRINGER
Format : EPUB
Livre Chapitre
Cet article est proposé par Chapitre.com, partenaire du Club.
Le suivi de votre commande sera assuré par France Loisirs.
Vente E-Book :                                    Test Generation of Crosstalk Delay Faults in VLSI Circuits
- S. Jayanthy  - M.C. Bhuvaneswari
Achat E-Book : Test Generation of Crosstalk Delay Faults in VLSI Circuits - S. Jayanthy - M.C. Bhuvaneswari

Prix E-Book 137,13

En stock

Test Generation of Crosstalk Delay...